Automated, 100-Specimen Loading and Imaging System for Transmission Electron Microscopy
نویسندگان
چکیده
منابع مشابه
Specimen collection for electron microscopy.
were “unknown agents.” For the sake of objectivity, we based our assumption on the aggregate of information for known pathogens rather than on “expert opinion.” Interestingly, however, the Council of Science and Technology’s “expert opinion” of the percentage of diarrheal illness due to foodborne transmission was 35% (1), nearly identical to the figure we developed. As noted in our article, pat...
متن کاملSpecimen collection for electron microscopy.
analysis of PCR products amplified from five strains of spotted fever group Rickettsiae with Rr with Rr 190. synthase gene comparison, a new tool for phylogenetic analysis, and its application for the Rickettsiae. To the Editor: As virologists whose specialties include diagnostic electron microscopy (EM), we read with interest the discussion on bioterrorism scenarios (1,2) and the subsequent no...
متن کاملSpecimen Preparation for Electron Microscopy
In general the SEM sample preparation techniques are more or less similar to the metallographic sample preparation technique for optical microscopy, because both the microscopes reveals the surface topography of sample. In SEM a focussed beam of electrons scans over the specimen surface and the electrons emitted from the sample surface controls the brightness of the CRT spot which also scans th...
متن کاملLattice Imaging in Transmission Electron Microscopy
With the resolution becoming sufficient to reveal individual atoms, high-resolution electron microscopy (HREM) can now compete with X-ray and neutron methods to determine quantitatively atomic structures of materials, with the advantage of being applicable to non-periodic objects such as crystal defects. An introduction to the theory and practical aspects of HREM is given. Principles of other l...
متن کاملTransmission electron microscopy at 20 kV for imaging and spectroscopy.
The electron optical performance of a transmission electron microscope (TEM) is characterized for direct spatial imaging and spectroscopy using electrons with energies as low as 20 keV. The highly stable instrument is equipped with an electrostatic monochromator and a C(S)-corrector. At 20 kV it shows high image contrast even for single-layer graphene with a lattice transfer of 213 pm (tilted i...
متن کاملذخیره در منابع من
با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید
ژورنال
عنوان ژورنال: Microscopy and Microanalysis
سال: 2006
ISSN: 1431-9276,1435-8115
DOI: 10.1017/s143192760606291x